On the Generation of Waveform-Accurate Hazard and Charge-Sharing Aware Tests for Transistor Stuck-Off Faults in CMOS Logic Circuits.
Jan BurchardDominik ErbSudhakar M. ReddyAdit D. SinghBernd BeckerPublished in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2018)