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Multi-cycle Circuit Parameter Independent ATPG for interconnect open defects.

Dominik ErbKarsten ScheiblerMatthias SauerSudhakar M. ReddyBernd Becker
Published in: VTS (2015)
Keyphrases
  • high speed
  • defect detection
  • frequency response
  • data mining
  • social networks
  • evolutionary algorithm
  • parameter values