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Circuit Parameter Independent Test Pattern Generation for Interconnect Open Defects.
Dominik Erb
Karsten Scheibler
Matthias Sauer
Sudhakar M. Reddy
Bernd Becker
Published in:
ATS (2014)
Keyphrases
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high speed
power dissipation
low power
printed circuit boards
power consumption
frequency response
real time
analog circuits
digital circuits
circuit design
parameter settings
parameter values
parallel algorithm
steady state
maximum likelihood
low cost
bayesian networks
genetic algorithm
data sets