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FAST-BIST: Faster-than-at-Speed BIST targeting hidden delay defects.

Sybille HellebrandThomas IndlekoferMatthias KampmannMichael A. KochteChang LiuHans-Joachim Wunderlich
Published in: ITC (2014)
Keyphrases
  • built in self test
  • high speed
  • real time
  • machine learning
  • information systems
  • feature extraction
  • memory efficient