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Interplay of Failure Rate, Performance, and Test Cost in TCAM under Process Variations.

Hsunwei HsiungDa ChengBin LiuRamesh GovindanSandeep K. Gupta
Published in: Asian Test Symposium (2013)
Keyphrases
  • failure rate
  • peer to peer
  • random variables
  • production process
  • parallel search