Design and test of latch-based circuits to maximize performance, yield, and delay test quality.

Kun Young Chung Sandeep K. Gupta

Published in: ITC (2010)

Keyphrases

building blocks
neural network
power dissipation
cost effectiveness
high quality
experimental design
design process
power reduction
test generation
statistical tests
engineering design
test cases
database
case study
website
genetic algorithm
real time