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Modeling and Simulation for Crosstalk Aggravated by Weak-Bridge Defects between On-Chip Interconnects.
Lei Wang
Sandeep K. Gupta
Melvin A. Breuer
Published in:
Asian Test Symposium (2004)
Keyphrases
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reliability assessment
discrete event simulation
input output
simulation model
data sets
image processing
database
high speed
signal processing
mathematical model
parallel processing
modeling method
printed circuit boards
agent based modeling
vlsi implementation
chip design