Yield-per-Area Optimization for 6T-SRAMs Using an Integrated Approach to Exploit Spares and ECC to Efficiently Combat High Defect and Soft-Error Rates.
Jae Chul ChaSandeep K. GuptaPublished in: Asian Test Symposium (2011)
Keyphrases
- error rate
- error correction
- real time
- optimization problems
- optimization algorithm
- discrete optimization
- optimization model
- optimization methods
- error free
- error detection
- error analysis
- highly efficient
- prediction error
- global optimization
- combinatorial optimization
- optimization method
- wide range
- learning algorithm