Path-Delay Fault Simulation for Circuits with Large Numbers of Paths for Very Large Test Sets.
Nabil M. AbdulrazzaqSandeep K. GuptaPublished in: VTS (2003)
Keyphrases
- test set
- shortest path
- error rate
- optimal path
- training set
- path length
- multiple paths
- multipath routing
- training data
- test cases
- test data
- evaluation methodology
- fault diagnosis
- path selection
- path finding
- fault detection
- simulation model
- delay insensitive
- training and test sets
- data sets
- path queries
- image processing
- machine learning
- neural network