Test Generation for Maximizing Ground Bounce Considering Circuit Delay.

Yi-Shing Chang Sandeep K. Gupta Melvin A. Breuer

Published in: VTS (2003)

Keyphrases

test generation
test cases
power dissipation
design automation
symbolic execution
high speed
test sequences
static analysis
mutation testing
phase locked loop
circuit design
regression testing
software testing
low power
power consumption
cmos technology
vision system
case study
code coverage