Extending pre-silicon delay models for post-silicon tasks: Validation, diagnosis, delay testing, and speed binning.

Prasanjeet Das Sandeep K. Gupta

Published in: VTS (2013)

Keyphrases

high speed
low cost
high density
critical path
real time
data mining
decision trees
bayesian networks
probabilistic model
model selection
test cases
statistical models
medical diagnosis
fault detection
structural model
model validation