STRAIGHT LINE
Experts
- Micha Sharir
- Josef Kittler
- Csaba D. Tóth
- Jianzhuang Liu
- Fabrizio Frati
- Hongbin Zha
- Azriel Rosenfeld
- Salvatore Tabbone
- Giuseppe Liotta
- Peter B. Scott
- Stephen G. Kobourov
- Olivier D. Faugeras
- Luc Van Gool
- Pankaj K. Agarwal
- P. A. C. Varley
- Adrian Dumitrescu
- Zhanyi Hu
- Xiaoou Tang
- Mark S. Nixon
- Michael Kaufmann
- Mauro Carlo Beltrametti
- Xianghua Ying
- John Illingworth
- Rafael Grompone von Gioi
- Hiroyasu Koshimizu
- Mark B. Sandler
- Maurizio Patrignani
- Herbert Edelsbrunner
- Alexander Wolff
- Ralph R. Martin
- Leonidas J. Guibas
- Anna Maria Massone
- Stefan Felsner
- Dmitry P. Nikolaev
- Lionel Garnier
- Jack Snoeyink
- Michael T. Goodrich
- Robert Wille
- Oleg Verbitsky
Venues
- CoRR
- Pattern Recognit.
- Pattern Recognit. Lett.
- IEEE Trans. Pattern Anal. Mach. Intell.
- CVPR
- ICPR
- ICIP
- Discret. Math.
- ICRA
- IROS
- ICCV
- Sensors
- IEEE Access
- ICASSP
- Image Vis. Comput.
- IEEE Trans. Image Process.
- Discret. Comput. Geom.
- IGARSS
- Comput. Geom.
- ICDAR
- BMVC
- Discret. Appl. Math.
- CCCG
- Comput. Aided Des.
- Inf. Process. Lett.
- Graph Drawing
- IEEE Trans. Instrum. Meas.
- Int. J. Comput. Vis.
- Comput. Graph. Forum
- ACM Trans. Graph.
- Comput. Vis. Image Underst.
- Remote. Sens.
- Comput. Vis. Graph. Image Process.
- MVA
- IEEE Trans. Geosci. Remote. Sens.
- Mach. Vis. Appl.
- IEEE Geosci. Remote. Sens. Lett.
- Comput. Aided Geom. Des.
- SCG
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