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Test Escapes of Stuck-Open Faults Caused by Parasitic Capacitances and Leakage Currents.

Daniel ArumíRosa Rodríguez-MontañésJoan Figueras
Published in: IEEE Trans. Very Large Scale Integr. Syst. (2016)
Keyphrases
  • test cases
  • fault detection
  • information systems
  • search algorithm
  • test data
  • built in self test
  • search engine
  • decision making
  • artificial neural networks
  • fault diagnosis
  • software testing
  • test sequences