Effects of hot carrier and irradiation stresses on advanced excimer laser annealed polycrystalline silicon thin film transistors.
Dimitrios N. KouvatsosVojkan DavidovicGeorge J. PapaioannouNinoslav StojadinovicLoukas MichalasM. A. ExarchosApostolos T. VoutsasDimitrios GoustouridisPublished in: Microelectron. Reliab. (2004)