Apostolos T. Voutsas

Publication Activity (10 Years)

Years Active: 2004-2012
Publications (10 Years): 0

Top Topics

Chemical Vapor Deposition

Room Temperature

Experimental Study

Top Venues

Microelectron. Reliab.

Publications

Loukas Michalas, Anastasia Syntychaki, Matroni Koutsoureli, George J. Papaioannou, Apostolos T. Voutsas
A temperature study of photosensitivity in SLS polycrystalline silicon TFTs. Microelectron. Reliab. 52 (9-10) (2012)
Despina C. Moschou, Giannis P. Kontogiannopoulos, Dimitrios N. Kouvatsos, Apostolos T. Voutsas
parameter on LTPS TFT stressing behavior. Microelectron. Reliab. 50 (2) (2010)
Loukas Michalas, George J. Papaioannou, Apostolos T. Voutsas
Degradation of polycrystalline silicon TFTs due to alpha particles irradiation stress. Microelectron. Reliab. 50 (9-11) (2010)
Despina C. Moschou, M. A. Exarchos, Dimitrios N. Kouvatsos, George J. Papaioannou, Aggeliki Arapoyanni, Apostolos T. Voutsas
Reliability and defectivity comparison of n- and p-channel SLS ELA polysilicon TFTs fabricated with a novel crystallization technique. Microelectron. Reliab. 48 (8-9) (2008)
F. V. Farmakis, Giannis P. Kontogiannopoulos, Dimitrios N. Kouvatsos, Apostolos T. Voutsas
Degradation of double-gate polycrystalline silicon TFTs due to hot carrier stress. Microelectron. Reliab. 47 (9-11) (2007)
Despina C. Moschou, M. A. Exarchos, Dimitrios N. Kouvatsos, George J. Papaioannou, Apostolos T. Voutsas
Performance and reliability of SLS ELA polysilicon TFTs fabricated with novel crystallization techniques. Microelectron. Reliab. 47 (9-11) (2007)
Vojkan Davidovic, Dimitrios N. Kouvatsos, Ninoslav Stojadinovic, Apostolos T. Voutsas
Influence of polysilicon film thickness on radiation response of advanced excimer laser annealed polycrystalline silicon thin film transistors. Microelectron. Reliab. 47 (9-11) (2007)
Loukas Michalas, M. A. Exarchos, George J. Papaioannou, Dimitrios N. Kouvatsos, Apostolos T. Voutsas
An experimental study of the thermally activated processes in polycrystalline silicon thin film transistors. Microelectron. Reliab. 47 (12) (2007)
Dimitrios N. Kouvatsos, Vojkan Davidovic, George J. Papaioannou, Ninoslav Stojadinovic, Loukas Michalas, M. A. Exarchos, Apostolos T. Voutsas, Dimitrios Goustouridis
Effects of hot carrier and irradiation stresses on advanced excimer laser annealed polycrystalline silicon thin film transistors. Microelectron. Reliab. 44 (9-11) (2004)