Loukas Michalas

Publication Activity (10 Years)

Years Active: 2004-2021
Publications (10 Years): 7

Top Topics

Gate Dielectrics

Electrical Properties

Top Venues

Microelectron. Reliab.

Publications

Thomas Abbey, Alexantrou Serb, Spyros Stathopoulos, Loukas Michalas, Themis Prodromakis
Emulating homoeostatic effects with metal-oxide memristors T-dependence. CoRR (2021)
Georgios Papandroulidakis, Loukas Michalas, Alexander Serb, Ali Khiat, Geoff V. Merrett, Themistoklis Prodromakis
A Digital In-Analogue Out Logic Gate Based on Metal-Oxide Memristor Devices. ISCAS (2019)
Thomas Abbey, Alexandru Serb, Nikolaos Vasilakis, Loukas Michalas, Ali Khiat, Spyros Stathopoulos, Themis Prodromakis
An Embedded Environmental Control Micro-chamber System for RRAM Memristor Characterisation. ISCAS (2018)
Georgios Papandroulidakis, Ali Khiat, Alexander Serb, Spyros Stathopoulos, Loukas Michalas, Themis Prodromakis
Metal Oxide-enabled Reconfigurable Memristive Threshold Logic Gates. ISCAS (2018)
Thomas Abbey, Alexander Serb, Nikolaos Vasilakis, Loukas Michalas, Ali Khiat, Spyros Stathopoulos, Themis Prodromakis
Live Demonstration: An Embedded Environmental Control Micro-chamber System for RRAM Memristor Characterisation. ISCAS (2018)
Matroni Koutsoureli, A. Zevgolatis, S. Saada, C. Mer-Calfati, Loukas Michalas, George J. Papaioannou, Philippe Bergonzo
Dielectric charging phenomena in diamond films used in RF MEMS capacitive switches: The effect of film thickness. Microelectron. Reliab. 64 (2016)
Matroni Koutsoureli, D. Birmpiliotis, Loukas Michalas, George J. Papaioannou
An in depth analysis of pull-up capacitance-voltage characteristic for dielectric charging assessment of MEMS capacitive switches. Microelectron. Reliab. 64 (2016)
Matroni Koutsoureli, Loukas Michalas, E. Papandreou, George J. Papaioannou
dielectric films used in RF MEMS capacitive switches. Microelectron. Reliab. 55 (9-10) (2015)
Loukas Michalas, Matroni Koutsoureli, E. Papandreou, Flavio Giacomozzi, George J. Papaioannou
Dielectric charging effects in floating electrode MEMS capacitive switches. Microelectron. Reliab. 55 (9-10) (2015)
Panagiotis Giounanlis, Elena Blokhina, Orla Feely, Loukas Michalas, Matroni Koutsoureli, George J. Papaioannou
Modelling of the dynamical behaviour of floating electrode MEMS. ISCAS (2015)
Matroni Koutsoureli, Loukas Michalas, Anestis Gantis, George J. Papaioannou
A study of deposition conditions on charging properties of PECVD silicon nitride films for MEMS capacitive switches. Microelectron. Reliab. 54 (9-10) (2014)
Matroni Koutsoureli, Loukas Michalas, P. Martins, E. Papandreou, A. Leuliet, S. Bansropun, George J. Papaioannou, A. Ziaei
Properties of contactless and contacted charging in MEMS capacitive switches. Microelectron. Reliab. 53 (9-11) (2013)
Loukas Michalas, Anurag Garg, Ayyaswamy Venkattraman, Matroni Koutsoureli, Alina A. Alexeenko, Dimitrios Peroulis, George J. Papaioannou
A study of field emission process in electrostatically actuated MEMS switches. Microelectron. Reliab. 52 (9-10) (2012)
Loukas Michalas, Anastasia Syntychaki, Matroni Koutsoureli, George J. Papaioannou, Apostolos T. Voutsas
A temperature study of photosensitivity in SLS polycrystalline silicon TFTs. Microelectron. Reliab. 52 (9-10) (2012)
Matroni Koutsoureli, Loukas Michalas, George J. Papaioannou
Temperature effects on the bulk discharge current of dielectric films of MEMS capacitive switches. Microelectron. Reliab. 52 (9-10) (2012)
Loukas Michalas, George J. Papaioannou, Apostolos T. Voutsas
Degradation of polycrystalline silicon TFTs due to alpha particles irradiation stress. Microelectron. Reliab. 50 (9-11) (2010)
Loukas Michalas, M. A. Exarchos, George J. Papaioannou, Dimitrios N. Kouvatsos, Apostolos T. Voutsas
An experimental study of the thermally activated processes in polycrystalline silicon thin film transistors. Microelectron. Reliab. 47 (12) (2007)
Dimitrios N. Kouvatsos, Vojkan Davidovic, George J. Papaioannou, Ninoslav Stojadinovic, Loukas Michalas, M. A. Exarchos, Apostolos T. Voutsas, Dimitrios Goustouridis
Effects of hot carrier and irradiation stresses on advanced excimer laser annealed polycrystalline silicon thin film transistors. Microelectron. Reliab. 44 (9-11) (2004)