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Off-state drain breakdown mechanisms of VDMOS with anti-JFET implantation.

Wing-Shan TamSik-Lam SiuBing-Liang YangChi-Wah KokHei Wong
Published in: Microelectron. Reliab. (2011)
Keyphrases
  • state space
  • real time
  • trade off
  • knowledge base
  • optimal solution
  • multi agent systems
  • computational complexity
  • significant improvement
  • state variables
  • early warning