Juin J. Liou

Publication Activity (10 Years)

Years Active: 1988-2019
Publications (10 Years): 10

Top Topics

Thin Film Transistor

Diabetes Mellitus

Multiscale Representation

Top Venues

Microelectron. Reliab.

Microelectron. J.

Publications

Hai-Cheng Wei, Na Ta, Wen-Rui Hu, Ming-Xia Xiao, Xiao-Jing Tang, Bagus Haryadi, Juin J. Liou, Hsien-Tsai Wu
Digital Volume Pulse Measured at the Fingertip as an Indicator of Diabetic Peripheral Neuropathy in the Aged and Diabetic. Entropy 21 (12) (2019)
Bagus Haryadi, Juin J. Liou, Hai-Cheng Wei, Ming-Xia Xiao, Hsien-Tsai Wu, Cheuk-Kwan Sun
Application of multiscale Poincaré short-time computation versus multiscale entropy in analyzing fingertip photoplethysmogram amplitudes to differentiate diabetic from non-diabetic subjects. Comput. Methods Programs Biomed. 166 (2018)
Zhaonian Yang, Yuan Yang, Ningmei Yu, Juin J. Liou
Statically triggered 3×VDD-Tolerant ESD detection circuit in a 90-nm low-voltage CMOS process. Microelectron. J. 78 (2018)
Tao Hu, Shurong Dong, Hao Jin, Hei Wong, Zekun Xu, Xiang Li, Juin J. Liou
A double snapback SCR ESD protection scheme for 28 nm CMOS process. Microelectron. Reliab. 84 (2018)
Chuan-Hsi Liu, Chun-Hu Cheng, Chin-Pao Cheng, Juin J. Liou
Editorial: IEDMS 2016. Microelectron. Reliab. 83 (2018)
Adelmo Ortiz-Conde, Andrea Sucre-González, Fabián Zárate-Rincón, Reydezel Torres-Torres, Roberto S. Murphy-Arteaga, Juin J. Liou, Francisco J. García-Sánchez
A review of DC extraction methods for MOSFET series resistance and mobility degradation model parameters. Microelectron. Reliab. 69 (2017)
Fan Liu, Zhiwei Liu, Jizhi Liu, Cheng Hui, Zhao Liu, Tian Rui, Shiyu Song, Juin J. Liou
A novel vertical SCR for ESD protection in 40 V HV bipolar process. Microelectron. Reliab. 78 (2017)
Aihua Dong, Javier A. Salcedo, Srivatsan Parthasarathy, Yuanzhong (Paul) Zhou, Sirui Luo, Jean-Jacques Hajjar, Juin J. Liou
ESD protection structure with reduced capacitance and overshoot voltage for high speed interface applications. Microelectron. Reliab. 79 (2017)
Weihuai Wang, Hao Jin, Wei Guo, Shurong Dong, Wei Liang, Juin J. Liou, Yan Han
Very small snapback silicon-controlled rectifier for electrostatic discharge protection in 28 nm processing. Microelectron. Reliab. 61 (2016)
Wei Liang, Aihua Dong, Hang Li, Meng Miao, Chung-Chen Kuo, Maxim Klebanov, Juin J. Liou
Characteristics of ESD protection devices operated under elevated temperatures. Microelectron. Reliab. 66 (2016)
Francisco J. García-Sánchez, Adelmo Ortiz-Conde, Juan Muci, Andrea Sucre-González, Juin J. Liou
A unified look at the use of successive differentiation and integration in MOSFET model parameter extraction. Microelectron. Reliab. 55 (2) (2015)
Juin J. Liou, Chun-Chieh Lin, Chu-Hsuan Lin
Editorial. Microelectron. Reliab. 55 (11) (2015)
Meng Miao, Yuanzhong (Paul) Zhou, Javier A. Salcedo, Jean-Jacques Hajjar, Juin J. Liou
Compact failure modeling for devices subject to electrostatic discharge stresses - A review pertinent to CMOS reliability simulation. Microelectron. Reliab. 55 (1) (2015)
Yunfeng Xi, Javier A. Salcedo, Yuanzhong (Paul) Zhou, Juin J. Liou, Jean-Jacques Hajjar
Design and characterization of ESD solutions with EMC robustness for automotive applications. Microelectron. Reliab. 55 (11) (2015)
Qiang Cui, Srivatsan Parthasarathy, Javier A. Salcedo, Juin J. Liou, Jean-Jacques Hajjar, Yuanzhong (Paul) Zhou
Design optimization of SiGe BiCMOS Silicon Controlled Rectifier for Charged Device Model (CDM) protection applications. Microelectron. Reliab. 54 (1) (2014)
Juin J. Liou
Challenges on designing electrostatic discharge protection solutions for low power electronics. ISLPED (2013)
Qiang Cui, Shuyun Zhang, Juin J. Liou
Novel ESD protection solution for single-ended mixer in GaAs pHEMT technology. Microelectron. Reliab. 53 (7) (2013)
Adelmo Ortiz-Conde, Francisco J. García-Sánchez, Juan Muci, Alberto Terán Barrios, Juin J. Liou, Ching-Sung Ho
Revisiting MOSFET threshold voltage extraction methods. Microelectron. Reliab. 53 (1) (2013)
Yuanzhong (Paul) Zhou, David Ellis, Jean-Jacques Hajjar, Andrew Olney, Juin J. Liou
: A new method for quantifying the effectiveness of ESD protection for the CDM classification test. Microelectron. Reliab. 53 (2) (2013)
Nan-Xiong Huang, Hsi Rong Han, Wen Tui Liao, Chih-Hung Huang, Wen Chun Wang, Miin-Shyue Shiau, Ching-Hwa Cheng, Hong-Chong Wu, Heng-Shou Hsu, Juin J. Liou, Shry-Sann Liao, Ruei-Cheng Sun, Guang-Bao Lu, Don-Gey Liu
Integrated amorphous-Si TFT circuits for gate drivers on LCD panels. ASICON (2013)
Juin J. Liou, Chang Jiang, Feng Chia
Electrostatic discharge (ESD) protection of RF integrated circuits. APCCAS (2012)
Blerina Aliaj, Vladislav A. Vashchenko, Andrei Shibkov, Juin J. Liou
Self-protection capability of integrated NLDMOS power arrays in ESD pulse regimes. Microelectron. Reliab. 51 (12) (2011)
Hsien-Chin Chiu, Chia-Shih Cheng, Hsuan-Ling Kao, Jeffrey S. Fu, Qiang Cui, Juin J. Liou
A fully on-chip ESD protection UWB-band low noise amplifier using GaAs enhancement-mode dual-gate pHEMT technology. Microelectron. Reliab. 51 (12) (2011)
Juin J. Liou, Chang Jiang, Cao Guang-Biao, Chang Gung, Feng Chia
Challenges of electrostatic discharge (ESD) protection in emerging silicon nanowire technology. ASICON (2011)
Xiang Liu, Jiann-Shiun Yuan, Juin J. Liou
Thermal reliability of VCO using InGaP/GaAs HBTs. Microelectron. Reliab. 51 (12) (2011)
Adelmo Ortiz-Conde, Francisco J. García-Sánchez, Juin J. Liou, Ching-Sung Ho
Integration-based approach to evaluate the sub-threshold slope of MOSFETs. Microelectron. Reliab. 50 (2) (2010)
Xiang Liu, Jiann-Shiun Yuan, Juin J. Liou
Electro-thermal stress effect on InGaP/GaAs heterojunction bipolar low-noise amplifier performance. Microelectron. Reliab. 50 (3) (2010)
Juin J. Liou, Chao-Sung Lai
Editorial. Microelectron. Reliab. 50 (5) (2010)
Hei Wong, Y. Fu, Juin J. Liou, Y. Yue
Hot-carrier reliability and breakdown characteristics of multi-finger RF MOS transistors. Microelectron. Reliab. 49 (1) (2009)
Adelmo Ortiz-Conde, Francisco J. García-Sánchez, Juan Muci, Denise C. Lugo Muñoz, Álvaro D. Latorre Rey, Ching-Sung Ho, Juin J. Liou
Indirect fitting procedure to separate the effects of mobility degradation and source-and-drain resistance in MOSFET parameter extraction. Microelectron. Reliab. 49 (7) (2009)
Xiang Liu, Jiann-Shiun Yuan, Juin J. Liou
InGaP/GaAs heterojunction bipolar transistor and RF power amplifier reliability. Microelectron. Reliab. 48 (8-9) (2008)
Xiaoyang Du, Shurong Dong, Yan Han, Juin J. Liou, Mingxu Huo, You Li, Qiang Cui, Dahai Huang, Demiao Wang
Evaluation of RF electrostatic discharge (ESD) protection in 0.18-µm CMOS technology. Microelectron. Reliab. 48 (7) (2008)
You Li, Juin J. Liou, Jim Vinson
Investigation of diode geometry and metal line pattern for robust ESD protection applications. Microelectron. Reliab. 48 (10) (2008)
You-Lin Wu, Shi-Tin Lin, Tsung-Min Chang, Juin J. Liou
Reliability study of ultrathin oxide films subject to irradiation-then-stress treatment using conductive atomic force microscopy. Microelectron. Reliab. 47 (2-3) (2007)
Y. Fu, Hei Wong, Juin J. Liou
Characterization and modeling of flicker noise in junction field-effect transistor with source and drain trench isolation. Microelectron. Reliab. 47 (1) (2007)
Javier A. Salcedo, Juin J. Liou, Muhammad Yaqub Afridi, Allen R. Hefner
On-chip electrostatic discharge protection for CMOS gas sensor systems-on-a-chip (SoC). Microelectron. Reliab. 46 (8) (2006)
Ching-Sung Ho, Kuo-Yin Huang, Ming Tang, Juin J. Liou
An analytical threshold voltage model of NMOSFETs with hot-carrier induced interface charge effect. Microelectron. Reliab. 45 (7-8) (2005)
Javier A. Salcedo, Juin J. Liou, Muhammad Yaqub Afridi, Allen R. Hefner
Novel electrostatic discharge protection structure for a monolithic gas sensor systems-on-a-chip. ISCAS (1) (2005)
Xiaofang Gao, Juin J. Liou, Joe Bernier, Gregg D. Croft, Waisum Wong, Satya Vishwanathan
Optimization of on-chip ESD protection structures for minimal parasitic capacitance. Microelectron. Reliab. 43 (5) (2003)
Juin J. Liou, Qiang Zhang, John McMacken, J. Ross Thomson, Kevin Stiles, Paul Layman
Statistical modeling of MOS devices for parametric yield prediction. Microelectron. Reliab. 42 (4-5) (2002)
Adelmo Ortiz-Conde, Francisco J. García-Sánchez, Juin J. Liou, Antonio Cerdeira, Magali Estrada, Y. Yue
A review of recent MOSFET threshold voltage extraction methods. Microelectron. Reliab. 42 (4-5) (2002)
Xiaofang Gao, Juin J. Liou, Joe Bernier, Gregg D. Croft, Adelmo Ortiz-Conde
Implementation of a comprehensive and robust MOSFET model in cadence SPICE for ESD applications. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 21 (12) (2002)
Juin J. Liou, R. Shireen, Adelmo Ortiz-Conde, Francisco J. García-Sánchez, Antonio Cerdeira, Xiaofang Gao, Xuecheng Zou, Ching-Sung Ho
Influence of polysilicon-gate depletion on the subthreshold behavior of submicron MOSFETs. Microelectron. Reliab. 42 (3) (2002)
Qiang Zhang, Juin J. Liou, John McMacken, J. Ross Thomson, Paul Layman
SPICE modeling and quick estimation of MOSFET mismatch based on BSIM3 model and parametric tests. IEEE J. Solid State Circuits 36 (10) (2001)
F. Schwierz, Juin J. Liou
Semiconductor devices for RF applications: evolution and current status. Microelectron. Reliab. 41 (2) (2001)
Min Shen, Ming-C. Cheng, Juin J. Liou
A Generalized Finite Element Method for Hydrodynamic Modeling of Short-channel Devices. VLSI Design 2001 (1) (2001)
Min Shen, Wai-Kay Yip, Ming-C. Cheng, Juin J. Liou
An Upstream Flux Splitting Method for Hydrodynamic Modeling of Deep Submicron Devices. VLSI Design 2001 (1) (2001)
Jui-Chu Lee, R. Young, Juin J. Liou, Gregg D. Croft, Joseph C. Bernier
An improved experimental setup for electrostatic discharge (ESD) measurements based on transmission line pulsing technique. IEEE Trans. Instrum. Meas. 50 (6) (2001)
Jim Vinson, Juin J. Liou
Electrostatic discharge in semiconductor devices: protection techniques. Proc. IEEE 88 (12) (2000)
Qiang Zhang, Juin J. Liou, John McMacken, Kevin Stiles, J. Ross Thomson, Paul Layman
An efficient and practical MOS statistical model for digital applications. ISCAS (2000)
Jim Vinson, Juin J. Liou
Electrostatic discharge in semiconductor devices: an overview. Proc. IEEE 86 (2) (1998)
Ching S. Ho, Juin J. Liou, Michael Georgiopoulos, Christos G. Christodoulou
A Mixed Analog/Digital VLSI Design and Simulation of An Adaptive Resonance Theory (ART) Neural Network Architecture. Simul. 66 (1) (1996)
W. W. Wong, Juin J. Liou
JFET circuit simulation using SPICE implemented with an improved model. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 13 (1) (1994)
Waisum Wong, Juin J. Liou, Jiann-Shiun Yuan, David M. Wu
Statistical sensitivity simulation for integrating design and testing of MOSFET integrated circuits. VTS (1991)
Jiann-Shiun Yuan, Juin J. Liou, David M. Wu
Testing the impact of process defects on ECL power-delay performance. VTS (1991)
Juin J. Liou, Frederik A. Lindholm
Capacitance of semiconductor p-n junction space-charge layers: an overview. Proc. IEEE 76 (11) (1988)