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SPICE modeling and quick estimation of MOSFET mismatch based on BSIM3 model and parametric tests.
Qiang Zhang
Juin J. Liou
John McMacken
J. Ross Thomson
Paul Layman
Published in:
IEEE J. Solid State Circuits (2001)
Keyphrases
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modeling method
parametric models
parameter estimation
experimental data
formal model
estimation algorithm
high level
conceptual model
data sets
test cases
theoretical framework
statistical model
test data
modeling framework