John McMacken

Publication Activity (10 Years)

Years Active: 2000-2002
Publications (10 Years): 0

Publications

Juin J. Liou, Qiang Zhang, John McMacken, J. Ross Thomson, Kevin Stiles, Paul Layman
Statistical modeling of MOS devices for parametric yield prediction. Microelectron. Reliab. 42 (4-5) (2002)
Qiang Zhang, Juin J. Liou, John McMacken, J. Ross Thomson, Paul Layman
SPICE modeling and quick estimation of MOSFET mismatch based on BSIM3 model and parametric tests. IEEE J. Solid State Circuits 36 (10) (2001)
Qiang Zhang, Juin J. Liou, John McMacken, Kevin Stiles, J. Ross Thomson, Paul Layman
An efficient and practical MOS statistical model for digital applications. ISCAS (2000)