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Statistical modeling of MOS devices for parametric yield prediction.
Juin J. Liou
Qiang Zhang
John McMacken
J. Ross Thomson
Kevin Stiles
Paul Layman
Published in:
Microelectron. Reliab. (2002)
Keyphrases
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statistical modeling
predictive modeling
statistical models
prediction accuracy
prediction algorithm
mobile devices
neural network
data mining
statistical model
prediction model
genetic algorithm
social networks
mobile applications