Revisiting MOSFET threshold voltage extraction methods.
Adelmo Ortiz-CondeFrancisco J. García-SánchezJuan MuciAlberto Terán BarriosJuin J. LiouChing-Sung HoPublished in: Microelectron. Reliab. (2013)
Keyphrases
- neural network
- optimization methods
- preprocessing
- computer vision
- empirical studies
- benchmark datasets
- databases
- feature selection
- knowledge base
- similarity measure
- multiscale
- artificial intelligence
- significant improvement
- information extraction
- denoising
- cross validation
- statistical methods
- qualitative and quantitative