Ching-Sung Ho

Publication Activity (10 Years)

Years Active: 2002-2013
Publications (10 Years): 0

Top Topics

Qualitative And Quantitative

Cross Validation

Top Venues

Microelectron. Reliab.

Publications

Adelmo Ortiz-Conde, Francisco J. García-Sánchez, Juan Muci, Alberto Terán Barrios, Juin J. Liou, Ching-Sung Ho
Revisiting MOSFET threshold voltage extraction methods. Microelectron. Reliab. 53 (1) (2013)
Adelmo Ortiz-Conde, Francisco J. García-Sánchez, Juin J. Liou, Ching-Sung Ho
Integration-based approach to evaluate the sub-threshold slope of MOSFETs. Microelectron. Reliab. 50 (2) (2010)
Adelmo Ortiz-Conde, Francisco J. García-Sánchez, Juan Muci, Denise C. Lugo Muñoz, Álvaro D. Latorre Rey, Ching-Sung Ho, Juin J. Liou
Indirect fitting procedure to separate the effects of mobility degradation and source-and-drain resistance in MOSFET parameter extraction. Microelectron. Reliab. 49 (7) (2009)
Ching-Sung Ho, Kuo-Yin Huang, Ming Tang, Juin J. Liou
An analytical threshold voltage model of NMOSFETs with hot-carrier induced interface charge effect. Microelectron. Reliab. 45 (7-8) (2005)
Juin J. Liou, R. Shireen, Adelmo Ortiz-Conde, Francisco J. García-Sánchez, Antonio Cerdeira, Xiaofang Gao, Xuecheng Zou, Ching-Sung Ho
Influence of polysilicon-gate depletion on the subthreshold behavior of submicron MOSFETs. Microelectron. Reliab. 42 (3) (2002)