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Influence of polysilicon-gate depletion on the subthreshold behavior of submicron MOSFETs.

Juin J. LiouR. ShireenAdelmo Ortiz-CondeFrancisco J. García-SánchezAntonio CerdeiraXiaofang GaoXuecheng ZouChing-Sung Ho
Published in: Microelectron. Reliab. (2002)
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