Adelmo Ortiz-Conde

Publication Activity (10 Years)

Years Active: 2001-2017
Publications (10 Years): 2

Top Topics

Single Parameter

Benchmark Datasets

Empirical Studies

Top Venues

Microelectron. Reliab.

Publications

Adelmo Ortiz-Conde, Andrea Sucre-González, Fabián Zárate-Rincón, Reydezel Torres-Torres, Roberto S. Murphy-Arteaga, Juin J. Liou, Francisco J. García-Sánchez
A review of DC extraction methods for MOSFET series resistance and mobility degradation model parameters. Microelectron. Reliab. 69 (2017)
Francisco J. García-Sánchez, Adelmo Ortiz-Conde, Juan Muci, Andrea Sucre-González, Juin J. Liou
A unified look at the use of successive differentiation and integration in MOSFET model parameter extraction. Microelectron. Reliab. 55 (2) (2015)
Adelmo Ortiz-Conde, Francisco J. García-Sánchez, Juan Muci, Alberto Terán Barrios, Juin J. Liou, Ching-Sung Ho
Revisiting MOSFET threshold voltage extraction methods. Microelectron. Reliab. 53 (1) (2013)
Denise C. Lugo Muñoz, Juan Muci, Adelmo Ortiz-Conde, Francisco J. García-Sánchez, Michelly de Souza, Marcelo Antonio Pavanello
An explicit multi-exponential model for semiconductor junctions with series and shunt resistances. Microelectron. Reliab. 51 (12) (2011)
Adelmo Ortiz-Conde, Francisco J. García-Sánchez, Juin J. Liou, Ching-Sung Ho
Integration-based approach to evaluate the sub-threshold slope of MOSFETs. Microelectron. Reliab. 50 (2) (2010)
Adelmo Ortiz-Conde, Francisco J. García-Sánchez, Juan Muci, Denise C. Lugo Muñoz, Álvaro D. Latorre Rey, Ching-Sung Ho, Juin J. Liou
Indirect fitting procedure to separate the effects of mobility degradation and source-and-drain resistance in MOSFET parameter extraction. Microelectron. Reliab. 49 (7) (2009)
Francisco J. García-Sánchez, Adelmo Ortiz-Conde, Jesús Finol, Ramón Salazar, Javier Salce
Comments on "A sinh Resistor and Its Application to tanh Linearization". IEEE J. Solid State Circuits 41 (10) (2006)
Francisco J. García-Sánchez, Adelmo Ortiz-Conde, Juan Muci
Understanding threshold voltage in undoped-body MOSFETs: An appraisal of various criteria. Microelectron. Reliab. 46 (5-6) (2006)
Rodolfo Quintero, Antonio Cerdeira, Adelmo Ortiz-Conde
Quasi-three-dimensional spice-based simulation of the transient behavior, including plasma spread, of thyristors and over-voltage protectors. Microelectron. Reliab. 42 (1) (2002)
Adelmo Ortiz-Conde, Francisco J. García-Sánchez, Juin J. Liou, Antonio Cerdeira, Magali Estrada, Y. Yue
A review of recent MOSFET threshold voltage extraction methods. Microelectron. Reliab. 42 (4-5) (2002)
Xiaofang Gao, Juin J. Liou, Joe Bernier, Gregg D. Croft, Adelmo Ortiz-Conde
Implementation of a comprehensive and robust MOSFET model in cadence SPICE for ESD applications. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 21 (12) (2002)
Juin J. Liou, R. Shireen, Adelmo Ortiz-Conde, Francisco J. García-Sánchez, Antonio Cerdeira, Xiaofang Gao, Xuecheng Zou, Ching-Sung Ho
Influence of polysilicon-gate depletion on the subthreshold behavior of submicron MOSFETs. Microelectron. Reliab. 42 (3) (2002)
Magali Estrada, Antonio Cerdeira, Adelmo Ortiz-Conde, Francisco J. García-Sánchez
Determination of trap cross-section in a-Si: H p-i-n diodes parameters using simulation and parameter extraction. Microelectron. Reliab. 41 (4) (2001)