A unified look at the use of successive differentiation and integration in MOSFET model parameter extraction.
Francisco J. García-SánchezAdelmo Ortiz-CondeJuan MuciAndrea Sucre-GonzálezJuin J. LiouPublished in: Microelectron. Reliab. (2015)
Keyphrases
- statistical model
- computational model
- cost function
- mathematical model
- high level
- management system
- single parameter
- parameter space
- theoretical framework
- least squares
- probabilistic model
- probability distribution
- data model
- information extraction
- artificial neural networks
- theoretical analysis
- database systems
- decision making
- search engine
- neural network
- databases
- formal model
- linear model
- data sets