A review of DC extraction methods for MOSFET series resistance and mobility degradation model parameters.
Adelmo Ortiz-CondeAndrea Sucre-GonzálezFabián Zárate-RincónReydezel Torres-TorresRoberto S. Murphy-ArteagaJuin J. LiouFrancisco J. García-SánchezPublished in: Microelectron. Reliab. (2017)