Chun-Hu Cheng

Publication Activity (10 Years)

Years Active: 2010-2022
Publications (10 Years): 7

Top Topics

Electrical Properties

Memory Capacity

Top Venues

Microelectron. Reliab.

Int. J. Circuit Theory Appl.

Publications

Chih-Feng Yen, Yu-Ya Huang, Shen-Hao Tsao, Shih-Hao Lin, Chun-Hu Cheng
Influence of Y2O3 Doped HfO2 High-k Films on Electrical Properties of MOS and MIM Devices. ICKII (2022)
Chia-Chi Fan, Chun-Yuan Tu, Ming-Huei Lin, Chun-Yen Chang, Chun-Hu Cheng, Yen-Liang Chen, Guan-Lin Liou, Chien Liu, Wu-Ching Chou, Hsiao-Hsuan Hsu
Interface engineering of ferroelectric negative capacitance FET for hysteresis-free switch and reliability improvement. IRPS (2018)
Chuan-Hsi Liu, Chun-Hu Cheng, Chin-Pao Cheng, Juin J. Liou
Editorial: IEDMS 2016. Microelectron. Reliab. 83 (2018)
Hsien-Chin Chiu, Min-Li Chou, Chun-Hu Cheng, Hsuan-Ling Kao, Cheng-Lin Cho
Effect of body bias and temperature on low-frequency noise in 40-nm nMOSFETs. Microelectron. Reliab. 78 (2017)
Chun-Yen Chang, Chia-Chi Fan, Chien Liu, Yu-Chien Chiu, Chun-Hu Cheng
High speed negative capacitance ferroelectric memory. ASICON (2017)
Hsuan-Ling Kao, Chih-Sheng Yeh, Hsien-Chin Chiu, Cheng-Lin Cho, Chun-Hu Cheng
A high output power and low phase noise GaN HEMT VCO with array of switchable inductors. Int. J. Circuit Theory Appl. 45 (11) (2017)
Hua-Chiang Wen, Wu-Ching Chou, Po-Chen Lin, Yeau-Ren Jeng, Chien-Chang Chen, Hung-Ming Chen, Don Son Jiang, Chun-Hu Cheng
Using nanoindentation to investigate the temperature cycling of Sn-37Pb solders. Microelectron. Reliab. 78 (2017)
Yu-Chien Chiu, Chun-Yen Chang, Hsiao-Hsuan Hsu, Chun-Hu Cheng, Min-Hung Lee
Impact of nanoscale polarization relaxation on endurance reliability of one-transistor hybrid memory using combined storage mechanisms. IRPS (2015)
Wun-Kai Wang, Hua-Chiang Wen, Chun-Hu Cheng, Ching-Hua Hung, Wu-Ching Chou, Wei-Hung Yau, Ping-Feng Yang, Yi-Shao Lai
/ZnO films. Microelectron. Reliab. 54 (12) (2014)
Bo-Ching He, Chun-Hu Cheng, Hua-Chiang Wen, Yi-Shao Lai, Ping-Feng Yang, Meng-Hung Lin, Wen-Fa Wu, Chang-Pin Chou
Evaluation of the nanoindentation behaviors of SiGe epitaxial layer on Si substrate. Microelectron. Reliab. 50 (1) (2010)