NI FE
Experts
- Simon Middelhoek
- Andrés Iván Oliva
- Walter E. Proebster
- Arthur V. Pohm
- Eric D. Diller
- Viktor Sverdlov
- Wolfgang Dietrich
- Xiao Zhang
- Jose Berengueres
- Eduard Llobet
- Zhaoxin Li
- Joseph S. Friedman
- Kenjiro Tadakuma
- Min Jun Kim
- J. E. Corona
- Armando Ramos Sebastian
- Yung Priscilla Lai
- James F. Freedman
- Brian K. Taylor
- Yi-Shao Lai
- Quan Yuan
- Jianbin Xu
- Ping-Feng Yang
- Jan Mackowiak
- Siegfried J. Methfessel
- Hua-Chiang Wen
- Haixia Zhang
- Dong-Ming Fang
- C. I. Calle
- Saswatee Banerjee
- Hyun-Tak Kim
- BruzzoneMarco Musso
- Skirmantas Kersulis
- Guoshuai Zhou
- Yanping Chen
- Jian Luo
- Tae Moon Roh
- Wun-Kai Wang
- Wei Liu
Venues
- Sensors
- NEMS
- Microelectron. Reliab.
- IBM J. Res. Dev.
- IEEE Access
- Microelectron. J.
- CoRR
- Symmetry
- IEEE SENSORS
- IROS
- IEEE Trans. Instrum. Meas.
- Entropy
- IEEE Trans. Biomed. Eng.
- NeuroImage
- ICRA
- Adv. Intell. Syst.
- IEEE Trans. Ind. Electron.
- IEEE Trans. Geosci. Remote. Sens.
- IEEE Trans. Electron. Comput.
- CCE
- IEICE Trans. Electron.
- Quantum Inf. Process.
- IFIP Congress
- I2MTC
- EMBC
- IRE Trans. Electron. Comput.
- IEEE Robotics Autom. Lett.
- J. Syst. Control. Eng.
- ICTON
- IAS
- Comput. Geosci.
- J. Vis.
- J. Comput. Phys.
- ICAIT
- URAI
- Commun. Nonlinear Sci. Numer. Simul.
- SENSORS
- Open Syst. Inf. Dyn.
- Comput. Phys. Commun.
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