Jean-Jacques Hajjar

Publication Activity (10 Years)

Years Active: 2012-2024
Publications (10 Years): 8

Top Topics

Normal Operation

Colored Petri Nets

Design Solutions

Top Venues

Microelectron. Reliab.

Publications

Shudong Huang, Srivatsan Parthasarathy, Yuanzhong Paul Zhou, Jean-Jacques Hajjar, Elyse Rosenbaum
Reduced RC Time Constant High Voltage Tolerant Supply Clamp for ESD Protection in 16nm FinFET Technology. IRPS (2024)
Shudong Huang, Srivatsan Parthasarathy, Yuanzhong Paul Zhou, Jean-Jacques Hajjar, Elyse Rosenbaum
Optimization of SCR for High-Speed Digital and RF Applications in 45-nm SOI CMOS Technology. IRPS (2023)
Shudong Huang, Srivatsan Parthasarathy, Yuanzhong Paul Zhou, Jean-Jacques Hajjar, Elyse Rosenbaum
A High Voltage Tolerant Supply Clamp for ESD Protection in a 45-nm SOI Technology. IRPS (2022)
Hang Li, Kalpathy B. Sundaram, Yuanzhong (Paul) Zhou, Javier A. Salcedo, Jean-Jacques Hajjar
Characterization and Modeling of the Transient Safe Operating Area in LDMOS Transistors. IRPS (2019)
Aihua Dong, Javier A. Salcedo, Srivatsan Parthasarathy, Yuanzhong (Paul) Zhou, Sirui Luo, Jean-Jacques Hajjar, Juin J. Liou
ESD protection structure with reduced capacitance and overshoot voltage for high speed interface applications. Microelectron. Reliab. 79 (2017)
Meng Miao, Yuanzhong (Paul) Zhou, Javier A. Salcedo, Jean-Jacques Hajjar, Juin J. Liou
Compact failure modeling for devices subject to electrostatic discharge stresses - A review pertinent to CMOS reliability simulation. Microelectron. Reliab. 55 (1) (2015)
Srivatsan Parthasarathy, Javier A. Salcedo, Sandro Herrera, Jean-Jacques Hajjar
ESD protection clamp with active feedback and mis-trigger immunity in 28nm CMOS process. IRPS (2015)
Yunfeng Xi, Javier A. Salcedo, Yuanzhong (Paul) Zhou, Juin J. Liou, Jean-Jacques Hajjar
Design and characterization of ESD solutions with EMC robustness for automotive applications. Microelectron. Reliab. 55 (11) (2015)
Qiang Cui, Srivatsan Parthasarathy, Javier A. Salcedo, Juin J. Liou, Jean-Jacques Hajjar, Yuanzhong (Paul) Zhou
Design optimization of SiGe BiCMOS Silicon Controlled Rectifier for Charged Device Model (CDM) protection applications. Microelectron. Reliab. 54 (1) (2014)
Yuanzhong (Paul) Zhou, Alan W. Righter, Jean-Jacques Hajjar
Investigation on effectiveness of series gate resistor in CDM ESD protection designs. ASICON (2013)
Yuanzhong (Paul) Zhou, David Ellis, Jean-Jacques Hajjar, Andrew Olney, Juin J. Liou
: A new method for quantifying the effectiveness of ESD protection for the CDM classification test. Microelectron. Reliab. 53 (2) (2013)
Yuanzhong (Paul) Zhou, Javier A. Salcedo, Jean-Jacques Hajjar
Modeling of high voltage devices for ESD event simulation in SPICE. Microelectron. J. 43 (5) (2012)