Elyse Rosenbaum

Publication Activity (10 Years)

Years Active: 1993-2024
Publications (10 Years): 21

Top Topics

Conditional Mutual Information

Differential Equations

Early Detection

Top Venues

Publications

Shudong Huang, Srivatsan Parthasarathy, Yuanzhong Paul Zhou, Jean-Jacques Hajjar, Elyse Rosenbaum
Reduced RC Time Constant High Voltage Tolerant Supply Clamp for ESD Protection in 16nm FinFET Technology. IRPS (2024)
Matthew Drallmeier, Yujie Zhou, Elyse Rosenbaum
On-Chip Single-Shot Pulse Generator for TDDB Characterization on a Sub-Nanosecond Timescale. IRPS (2024)
Weiman Yan, Ernest Wu, Alexander G. Schwing, Elyse Rosenbaum
Semantic Autoencoder for Modeling BEOL and MOL Dielectric Lifetime Distributions. IRPS (2023)
Yujie Zhou, David LaFonteese, Elyse Rosenbaum
Collector Engineering of ESD PNP in BCD Technologies. IRPS (2023)
Shudong Huang, Srivatsan Parthasarathy, Yuanzhong Paul Zhou, Jean-Jacques Hajjar, Elyse Rosenbaum
Optimization of SCR for High-Speed Digital and RF Applications in 45-nm SOI CMOS Technology. IRPS (2023)
Shudong Huang, Srivatsan Parthasarathy, Yuanzhong Paul Zhou, Jean-Jacques Hajjar, Elyse Rosenbaum
A High Voltage Tolerant Supply Clamp for ESD Protection in a 45-nm SOI Technology. IRPS (2022)
Alan Yang, Jie Xiong, Maxim Raginsky, Elyse Rosenbaum
Input-to-State Stable Neural Ordinary Differential Equations with Applications to Transient Modeling of Circuits. L4DC (2022)
Alan Yang, Jie Xiong, Maxim Raginsky, Elyse Rosenbaum
Input-to-State Stable Neural Ordinary Differential Equations with Applications to Transient Modeling of Circuits. CoRR (2022)
Shudong Huang, Elyse Rosenbaum
Compact Model of ESD Diode Suitable for Subnanosecond Switching Transients. IRPS (2021)
Milan Shah, Yujie Zhou, David LaFonteese, Elyse Rosenbaum
Considerations in High Voltage Lateral ESD PNP Design. IRPS (2021)
Jie Xiong, Alan Yang, Maxim Raginsky, Elyse Rosenbaum
Neural Networks for Transient Modeling of Circuits : Invited Paper. MLCAD (2021)
Alex Ayling, Shudong Huang, Elyse Rosenbaum
Sub-nanosecond Reverse Recovery Measurement for ESD Devices. IRPS (2020)
Alan Yang, AmirEmad Ghassami, Maxim Raginsky, Negar Kiyavash, Elyse Rosenbaum
Model-Augmented Conditional Mutual Information Estimation for Feature Selection. UAI (2020)
Yang Xiu, Elyse Rosenbaum
Analysis and Design of Integrated Voltage Regulators for Supply Noise Rejection During System-Level ESD. IEEE Trans. Circuits Syst. (12) (2020)
Artsiom Balakir, Alan Yang, Elyse Rosenbaum
An Interpretable Predictive Model for Early Detection of Hardware Failure. IRPS (2020)
Keven Feng, Sandeep Vora, Rui Jiang, Elyse Rosenbaum, Shobha Vasudevan
Guilty As Charged: Computational Reliability Threats Posed By Electrostatic Discharge-induced Soft Errors. DATE (2019)
Alan Yang, AmirEmad Ghassami, Maxim Raginsky, Negar Kiyavash, Elyse Rosenbaum
Model-Augmented Nearest-Neighbor Estimation of Conditional Mutual Information for Feature Selection. CoRR (2019)
Yang Xiu, Samuel Sagan, Advika Battini, Xiao Ma, Maxim Raginsky, Elyse Rosenbaum
Stochastic modeling of air electrostatic discharge parameters. IRPS (2018)
Yingyan Lin, Min-Sun Keel, Adam C. Faust, Aolin Xu, Naresh R. Shanbhag, Elyse Rosenbaum, Andrew C. Singer
A Study of BER-Optimal ADC-Based Receiver for Serial Links. IEEE Trans. Circuits Syst. I Regul. Pap. (5) (2016)
Kuo-Hsuan Meng, Vrashank Shukla, Elyse Rosenbaum
Full-Component Modeling and Simulation of Charged Device Model ESD. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 35 (7) (2016)
Kuo-Hsuan Meng, Zaichen Chen, Elyse Rosenbaum
Compact distributed multi-finger MOSFET model for circuit-level ESD simulation. Microelectron. Reliab. 63 (2016)
Zaichen Chen, Robert Mertens, Collin Reiman, Elyse Rosenbaum
Improved GGSCR layout for overshoot reduction. IRPS (2015)
Adam C. Faust, Rajan Narasimha, Karan S. Bhatia, Ankit Srivastava, Chhay Kong, Hyeon-Min Bae, Elyse Rosenbaum, Naresh R. Shanbhag
FEC-based 4 Gb/s backplane transceiver in 90nm CMOS. CICC (2012)
Nicholas Olson, Nathan Jack, Vrashank Shukla, Elyse Rosenbaum
CDM-ESD induced damage in components using stacked-die packaging. CICC (2011)
Elyse Rosenbaum, Vrashank Shukla, Min-Sun Keel
ESD protection networks for 3D integrated circuits. 3DIC (2011)
Farzan Farbiz, Elyse Rosenbaum
A new compact model for external latchup. Microelectron. Reliab. 49 (12) (2009)
Elyse Rosenbaum, Hyeon-Min Bae, Karan S. Bhatia, Adam C. Faust
Moving signals on and off chip. CICC (2009)
Kelvin K. Hsueh, Sin-Hao Ke, Jeffrey Lee, Elyse Rosenbaum
UVeriESD: An ESD verification tool for SoC design. APCCAS (2008)
Karan S. Bhatia, Sami Hyvonen, Elyse Rosenbaum
A Compact, ESD-Protected, SiGe BiCMOS LNA for Ultra-Wideband Applications. IEEE J. Solid State Circuits 42 (5) (2007)
Karan S. Bhatia, Sami Hyvonen, Elyse Rosenbaum
An 8-mW, ESD-protected, CMOS LNA for Ultra-Wideband Applications. CICC (2006)
Junjun Li, Sopan Joshi, Ryan Barnes, Elyse Rosenbaum
Compact modeling of on-chip ESD protection devices using Verilog-A. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 25 (6) (2006)
Hongmei Li, Cole E. Zemke, Giorgos Manetas, Vladimir I. Okhmatovski, Elyse Rosenbaum, Andreas C. Cangellaris
An automated and efficient substrate noise analysis tool. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 25 (3) (2006)
Elyse Rosenbaum, Sami Hyvonen
On-chip ESD protection for RF I/Os: devices, circuits and models. ISCAS (2) (2005)
Sami Hyvonen, Sopan Joshi, Elyse Rosenbaum
Comprehensive ESD protection for RF inputs. Microelectron. Reliab. 45 (2) (2005)
Rouwaida Kanj, Elyse Rosenbaum
Critical evaluation of SOI design guidelines. IEEE Trans. Very Large Scale Integr. Syst. 12 (9) (2004)
Rouwaida Kanj, Timothy Lehner, Bhavna Agrawal, Elyse Rosenbaum
Noise characterization of static CMOS gates. DAC (2004)
Sopan Joshi, Elyse Rosenbaum
Simulator-independent compact modeling of vertical npn transistors for ESD and RF circuit simulation. Microelectron. Reliab. 43 (7) (2003)
Junjun Li, Sopan Joshi, Elyse Rosenbaum
A Verilog-A compact model for ESD protection NMOSTs. CICC (2003)
Rouwaida Kanj, Elyse Rosenbaum
A critical look at design guidelines for SOI logic gates. ISCAS (3) (2002)
Hongmei Li, Jorge Carballido, Harry H. Yu, Vladimir I. Okhmatovski, Elyse Rosenbaum, Andreas C. Cangellaris
Comprehensive frequency-dependent substrate noise analysis using boundary element methods. ICCAD (2002)
Yu Wang, Patrick Juliano, Sopan Joshi, Elyse Rosenbaum
Electrothermal model for simulation of bulk-Si and SOI diodes in ESD protection circuits. Microelectron. Reliab. 41 (11) (2001)
Elyse Rosenbaum, Jie Wu
Trap generation and breakdown processes in very thin gate oxides. Microelectron. Reliab. 41 (5) (2001)
Jie Wu, Patrick Juliano, Elyse Rosenbaum
Breakdown and latent damage of ultra-thin gate oxides under ESD stress conditions. Microelectron. Reliab. 41 (11) (2001)
Danqing Chen, Erhong Li, Elyse Rosenbaum, Sung-Mo Kang
Interconnect thermal modeling for accurate simulation of circuittiming and reliability. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 19 (2) (2000)
Tong Li, Ching-Han Tsai, Elyse Rosenbaum, Sung-Mo Kang
Substrate Modeling and Lumped Substrate Resistance Extraction for CMOS ESD/Latchup Circuit Simulation. DAC (1999)
Danqing Chen, Erhong Li, Elyse Rosenbaum, Sung-Mo Kang
Interconnect thermal modeling for determining design limits on current density. ISPD (1999)
Yi-Kan Cheng, Prasun Raha, Chin-Chi Teng, Elyse Rosenbaum, Sung-Mo Kang
ILLIADS-T: an electrothermal timing simulator for temperature-sensitive reliability diagnosis of CMOS VLSI chips. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 17 (8) (1998)
Chin-Chi Teng, Yi-Kan Cheng, Elyse Rosenbaum, Sung-Mo Kang
iTEM: a temperature-dependent electromigration reliability diagnosis tool. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 16 (8) (1997)
Chin-Chi Teng, Yi-Kan Cheng, Elyse Rosenbaum, Sung-Mo Kang
Hierarchical Electromigration Reliability Diagnosis for VLSI Interconnects. DAC (1996)
Yi-Kan Cheng, Chin-Chi Teng, Abhijit Dharchoudhury, Elyse Rosenbaum, Sung-Mo Kang
iCET: A Complete Chip-Level Thermal Reliability Diagnosis Tool for CMOS VLSI Chips. DAC (1996)
Yi-Kan Cheng, Elyse Rosenbaum, Sung-Mo Kang
ETS-A: A New Electrothermal Simulator for CMOS VLSI Circuits. ED&TC (1996)
Robert H. Tu, Elyse Rosenbaum, Wilson Y. Chan, Chester C. Li, Eric Minami, Khandker Quader, Ping K. Ko, Chenming Hu
Berkeley reliability tools-BERT. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 12 (10) (1993)