Yi-Kan Cheng

Publication Activity (10 Years)

Years Active: 1995-2012
Publications (10 Years): 0

Top Topics

Temporal Difference

Design Methodology

Adaptive Sampling

Top Venues

Publications

Po-Cheng Pan, Hung-Ming Chen, Yi-Kan Cheng, Jill Liu, Wei-Yi Hu
Configurable analog routing methodology via technology and design constraint unification. ICCAD (2012)
Chin-Cheng Kuo, Wei-Yi Hu, Yi-Hung Chen, Jui-Feng Kuan, Yi-Kan Cheng
Efficient trimmed-sample Monte Carlo methodology and yield-aware design flow for analog circuits. DAC (2012)
Subarna Sinha, Qing Su, Linni Wen, Frank Lee, Charles C. Chiang, Yi-Kan Cheng, Jin-Lien Lin, Yu-Chyi Harn
A New Flexible Algorithm for Random Yield Improvement. ISQED (2007)
Yi-Kan Cheng, Sung-Mo Kang
A temperature-aware simulation environment for reliable ULSI chipdesign. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 19 (10) (2000)
Yi-Kan Cheng, David Bearden, Kanti Suryadevara
Microprocessor. ICCD (2000)
Yi-Kan Cheng, Sung-Mo Kang
An efficient method for hot-spot identification in ULSI circuits. ICCAD (1999)
Yi-Kan Cheng, Sung-Mo Kang
Temperature-driven power and timing analysis for CMOS ULSI circuits. ISCAS (6) (1999)
Yi-Kan Cheng, Prasun Raha, Chin-Chi Teng, Elyse Rosenbaum, Sung-Mo Kang
ILLIADS-T: an electrothermal timing simulator for temperature-sensitive reliability diagnosis of CMOS VLSI chips. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 17 (8) (1998)
Chin-Chi Teng, Yi-Kan Cheng, Elyse Rosenbaum, Sung-Mo Kang
iTEM: a temperature-dependent electromigration reliability diagnosis tool. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 16 (8) (1997)
Chin-Chi Teng, Yi-Kan Cheng, Elyse Rosenbaum, Sung-Mo Kang
Hierarchical Electromigration Reliability Diagnosis for VLSI Interconnects. DAC (1996)
Yi-Kan Cheng, Chin-Chi Teng, Abhijit Dharchoudhury, Elyse Rosenbaum, Sung-Mo Kang
iCET: A Complete Chip-Level Thermal Reliability Diagnosis Tool for CMOS VLSI Chips. DAC (1996)
Yi-Kan Cheng, Elyse Rosenbaum, Sung-Mo Kang
ETS-A: A New Electrothermal Simulator for CMOS VLSI Circuits. ED&TC (1996)
Yi-Kan Cheng, Sung-Mo Kang
Chip-Level Thermal Simulator to Predict VLSI Chip Temperature. ISCAS (1995)