Hierarchical Electromigration Reliability Diagnosis for VLSI Interconnects.
Chin-Chi TengYi-Kan ChengElyse RosenbaumSung-Mo KangPublished in: DAC (1996)
Keyphrases
- input output
- power dissipation
- signal processing
- model based diagnosis
- high speed
- fault diagnosis
- hierarchical structure
- vlsi implementation
- vlsi design
- hierarchical classification
- hierarchical model
- coarse to fine
- hierarchical clustering
- breast cancer diagnosis
- vlsi circuits
- real time
- medical diagnostic
- diagnostic tests
- multiple faults
- model based reasoning
- breast cancer
- computer vision
- genetic algorithm
- data mining
- neural network