iCET: A Complete Chip-Level Thermal Reliability Diagnosis Tool for CMOS VLSI Chips.
Yi-Kan ChengChin-Chi TengAbhijit DharchoudhuryElyse RosenbaumSung-Mo KangPublished in: DAC (1996)
Keyphrases
- high speed
- chip design
- single chip
- analog vlsi
- low power
- infrared
- focal plane
- low cost
- power dissipation
- high density
- circuit design
- vlsi circuits
- cmos image sensor
- vlsi design
- physical design
- medical diagnosis
- vlsi implementation
- real time
- design methodology
- mixed signal
- random access memory
- power consumption
- neural network
- image sensor
- cmos technology
- embedded systems
- diagnostic tool
- fault diagnosis