ILLIADS-T: an electrothermal timing simulator for temperature-sensitive reliability diagnosis of CMOS VLSI chips.
Yi-Kan ChengPrasun RahaChin-Chi TengElyse RosenbaumSung-Mo KangPublished in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (1998)
Keyphrases
- high speed
- chip design
- vlsi circuits
- low power
- single chip
- medical diagnosis
- model based diagnosis
- design methodology
- focal plane
- power dissipation
- power consumption
- fault diagnosis
- real time
- cmos image sensor
- simulation model
- signal processing
- physical design
- reliability analysis
- model based reasoning
- room temperature
- integrated circuit
- heat transfer
- vlsi implementation
- high temperature
- failure rate
- fault detection