Jie Wu

Publication Activity (10 Years)

Years Active: 2001-2001
Publications (10 Years): 0

Publications

Elyse Rosenbaum, Jie Wu
Trap generation and breakdown processes in very thin gate oxides. Microelectron. Reliab. 41 (5) (2001)
Jie Wu, Patrick Juliano, Elyse Rosenbaum
Breakdown and latent damage of ultra-thin gate oxides under ESD stress conditions. Microelectron. Reliab. 41 (11) (2001)