Meng Miao

Publication Activity (10 Years)

Years Active: 2010-2024
Publications (10 Years): 6

Top Topics

Competitive Advantage

Simulation Models

Banking Industry

Colored Petri Nets

Top Venues

IEEE Trans. Engineering Management

Microelectron. Reliab.

Publications

Meng Miao, Saide Saide, Silvia Ratna, Muhammad Muflih
Business Continuity Innovation in Disruption Time: Sociotechnical Systems, Business Analytics, Virtual Business, and Mediating Role of Knowledge Absorptive Capacity. IEEE Trans. Engineering Management 71 (2024)
Meng Miao, Saide Saide, Didi Muwardi
Positioning the Knowledge Creation and Business Strategy on Banking Industry in a Developing Country. IEEE Trans. Engineering Management 70 (6) (2023)
You Li, Meng Miao, Robert Gauthier
ESD Protection Design Overview in Advanced SOI and Bulk FinFET Technologies. CICC (2020)
Zhiqing Li, Baofu Zhu, Anindya Nath, Meng Miao, Alain Loiseau, You Li, Jeffrey B. Johnson, Souvick Mitra, Robert Gauthier
Understanding ESD Induced Thermal Mechanism in FinFETs Through Predictive TCAD Simulation. IRPS (2020)
Wei Liang, Aihua Dong, Hang Li, Meng Miao, Chung-Chen Kuo, Maxim Klebanov, Juin J. Liou
Characteristics of ESD protection devices operated under elevated temperatures. Microelectron. Reliab. 66 (2016)
Meng Miao, Yuanzhong (Paul) Zhou, Javier A. Salcedo, Jean-Jacques Hajjar, Juin J. Liou
Compact failure modeling for devices subject to electrostatic discharge stresses - A review pertinent to CMOS reliability simulation. Microelectron. Reliab. 55 (1) (2015)
Fei Ma, Yan Han, Shurong Dong, Meng Miao, Jianfeng Zheng, Jian Wu, Cheng-gong Han, Kehan Zhu
Investigation of ESD protection strategy in high voltage Bipolar-CMOS-DMOS process. Microelectron. Reliab. 52 (8) (2012)
Jian Wu, Shurong Dong, Mingliang Li, Meng Miao, Fei Ma, Jianfeng Zheng, Yan Han
A novel power-clamp assisted complementary MOSFET for robust ESD protection. Microelectron. Reliab. 52 (8) (2012)
Meng Miao, Shurong Dong, Mingliang Li, Jian Wu, Fei Ma, Jianfeng Zheng, Yan Han
A novel gate-suppression technique for ESD protection. Microelectron. Reliab. 52 (8) (2012)
Fei Ma, Yan Han, Bo Song, Shurong Dong, Meng Miao, Jianfeng Zheng, Jian Wu, Kehan Zhu
Substrate-engineered GGNMOS for low trigger voltage ESD in 65 nm CMOS process. Microelectron. Reliab. 51 (12) (2011)
Yan Han, Bo Song, Shurong Dong, Mingliang Li, Fei Ma, Meng Miao, Kehan Zhu
Study of current saturation behaviors in dual direction SCR for ESD applications. Microelectron. Reliab. 51 (2) (2011)
Bo Song, Yan Han, Shurong Dong, Fei Ma, Mingliang Li, Meng Miao, Kehan Zhu
Compact MOS-triggered SCR with faster turn-on speed for ESD protection. Microelectron. Reliab. 50 (9-11) (2010)