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Investigation of ESD protection strategy in high voltage Bipolar-CMOS-DMOS process.

Fei MaYan HanShurong DongMeng MiaoJianfeng ZhengJian WuCheng-gong HanKehan Zhu
Published in: Microelectron. Reliab. (2012)
Keyphrases
  • high voltage
  • normal operation
  • data sets
  • neural network
  • low cost
  • real time
  • training data
  • reinforcement learning
  • artificial neural networks
  • high speed
  • fuzzy sets
  • positive and negative