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Understanding ESD Induced Thermal Mechanism in FinFETs Through Predictive TCAD Simulation.
Zhiqing Li
Baofu Zhu
Anindya Nath
Meng Miao
Alain Loiseau
You Li
Jeffrey B. Johnson
Souvick Mitra
Robert Gauthier
Published in:
IRPS (2020)
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