: A new method for quantifying the effectiveness of ESD protection for the CDM classification test.
Yuanzhong (Paul) ZhouDavid EllisJean-Jacques HajjarAndrew OlneyJuin J. LiouPublished in: Microelectron. Reliab. (2013)
Keyphrases
- classification method
- detection method
- machine learning methods
- high accuracy
- significant improvement
- computational cost
- clustering method
- high precision
- classification accuracy
- benchmark data sets
- pattern recognition
- support vector machine svm
- unsupervised learning
- data sets
- classification algorithm
- decision rules
- cross validation
- accuracy rate
- classification process
- training samples
- feature extraction
- pattern classification
- computational complexity
- active learning
- training phase
- classification scheme
- accurate classification
- statistical tests
- test data
- model selection
- feature set
- dynamic programming
- pairwise
- preprocessing
- image segmentation
- decision trees
- learning algorithm
- machine learning
- neural network