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Statistical sensitivity simulation for integrating design and testing of MOSFET integrated circuits.
Waisum Wong
Juin J. Liou
Jiann-Shiun Yuan
David M. Wu
Published in:
VTS (1991)
Keyphrases
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integrated circuit
image analysis
statistical analysis
computer aided
simulation environment
design space
data sets
image processing
case study
wireless sensor networks
mathematical model
engineering design