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Characterization and modeling of flicker noise in junction field-effect transistor with source and drain trench isolation.
Y. Fu
Hei Wong
Juin J. Liou
Published in:
Microelectron. Reliab. (2007)
Keyphrases
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random noise
genetic algorithm
noise level
modeling method
image noise
mathematical analysis
real time
data sets
denoising
low cost
noisy data
image structure