InGaP/GaAs heterojunction bipolar transistor and RF power amplifier reliability.

Xiang Liu Jiann-Shiun Yuan Juin J. Liou

Published in: Microelectron. Reliab. (2008)

Keyphrases

field effect transistors
high power
high density
low power
power consumption
steady state
high speed
neural network
data sets
power dissipation
injection lasers
radio frequency
mathematical analysis
integrated circuit
low cost
relevance feedback
dynamic range
positive and negative