Electro-thermal stress effect on InGaP/GaAs heterojunction bipolar low-noise amplifier performance.
Xiang LiuJiann-Shiun YuanJuin J. LiouPublished in: Microelectron. Reliab. (2010)
Keyphrases
- injection lasers
- room temperature
- high noise
- high sensitivity
- low signal to noise ratio
- noise level
- image noise
- field effect transistors
- infrared
- missing data
- positive and negative
- noise sensitivity
- signal to noise ratio
- additive noise
- signal noise ratio
- high levels
- noisy data
- mobile robot
- image processing
- dynamic range
- arbitrary shape
- noise free
- neural network
- noise removal
- power plant
- face recognition