Login / Signup
Evaluation of RF electrostatic discharge (ESD) protection in 0.18-µm CMOS technology.
Xiaoyang Du
Shurong Dong
Yan Han
Juin J. Liou
Mingxu Huo
You Li
Qiang Cui
Dahai Huang
Demiao Wang
Published in:
Microelectron. Reliab. (2008)
Keyphrases
</>
cmos technology
low power
power consumption
spl times
case study
image sensor
low voltage