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/W MIM capacitors with the thickness of the bottom W electrode.

Danqun YuW. S. LauHei WongXuan FengShurong DongKin Leong Pey
Published in: Microelectron. Reliab. (2016)
Keyphrases
  • neural network
  • multiscale
  • data sets
  • integrated circuit
  • electric field
  • light scattering
  • real world
  • computer vision
  • reinforcement learning
  • multiresolution
  • cross section