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Modeling of terminal ring structures for high-voltage power MOSFETs.

Wing-Shan TamSik-Lam SiuOi-Ying WongChi-Wah KokHei WongV. Filip
Published in: Microelectron. Reliab. (2012)
Keyphrases
  • high voltage
  • power consumption
  • data mining
  • partial discharge
  • neural network
  • normal operation
  • artificial intelligence
  • operating conditions