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Comparative study of reliability degradation behaviors of LDMOS and LDMOS-SCR ESD protection devices.
Zhihui Yu
Hao Jin
Shurong Dong
Hei Wong
Jie Zeng
Weihuai Wang
Published in:
Microelectron. Reliab. (2016)
Keyphrases
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comparative study
mobile devices
highly reliable
human behavior
embedded systems
behavior analysis
behavior patterns
information systems
privacy protection
navigation systems
real time
personal computer
intelligent environments
behavior recognition
dynamic behaviors
protection scheme