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An Integrated Modeling Paradigm of Circuit Reliability for 65nm CMOS Technology.
Wenping Wang
Vijay Reddy
Anand T. Krishnan
Rakesh Vattikonda
Srikanth Krishnan
Yu Cao
Published in:
CICC (2007)
Keyphrases
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cmos technology
low power
spl times
power consumption
low voltage
parallel processing
power dissipation
silicon on insulator
high speed
low cost
mixed signal
image sensor
pattern recognition
computer vision
hidden markov models