Login / Signup

Time-Dependent Dielectric Breakdown Under AC Stress in GaN MIS-HEMTs.

Ethan S. LeeLuis HurtadoJungwoo JohSrikanth KrishnanSameer PendharkarJesús A. del Alamo
Published in: IRPS (2019)
Keyphrases
  • management information systems
  • information systems
  • structuring elements
  • travel time
  • leakage current
  • real time
  • neural network
  • low cost
  • decision support system
  • arc consistency
  • transmission line