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Time-Dependent Dielectric Breakdown Under AC Stress in GaN MIS-HEMTs.
Ethan S. Lee
Luis Hurtado
Jungwoo Joh
Srikanth Krishnan
Sameer Pendharkar
Jesús A. del Alamo
Published in:
IRPS (2019)
Keyphrases
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management information systems
information systems
structuring elements
travel time
leakage current
real time
neural network
low cost
decision support system
arc consistency
transmission line